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NSC and Physical Optics Propagation
Hello, I'm trying to simulate a system that focuses a beam with lenses after it reflects off of a DMD. I have made a rudimentary model of a DMD using NSC, but if I try to use POP I get an error message saying that the entrance pupil can't be located. I noticed that most of the posts that come up about POP show setups that are purely sequential. This might be a naive question, but is it not possible to use POP when you have non-sequential components in your system? Or is it because I have my entire system in non-sequential mode, so it doesn't take any of the lenses to be the entrance pupil? Using the regular ray tracing method in non-sequential mode doesn't show any of the expected diffraction from the mirrors, and I don't observe a Fourier transform where I would expect. Thanks for your help! Katya
Multiple detectors and merit function
Dear all, I have a NS system with multiple detectors and 2 design variables. I need a merit function taking the weighted sum of their total power for the 2D universal plot (only 2 different weights). Any idea how to do that? An alternative I've identified is to make a big detector with a mask on top (apertures = small detectors of the first weight), run the 2D univeral plot and then do it again with another large detector and mask for the small detectors of the 2nd weight. Then perform the weighted sum outside of OpticStudio. Still knowing whether it is possible or not to add the total power of multiple detectors as merit function would be valuable, and probably not only to me. Thank you in advance for your feedback!
Surface irregularity: RMS vs no. fringes
Hi all, In the tolerance wizard the surface irregularity is given by no. of fringes. Some vendors of lens give the surface irregularity in unit of RMS Angstrom. Is there any conversion factor between these two units? If not, is there any other way to overcome this disparnecy? Thanks a lot, Nadav
Edge thickness solve equivalent in multi-config?
Is there a way to use an edge thickness solve in multi-config? I was using them on my concave surfaces to create a dummy surface where the lens sits, but when I switched to multi-config, it appears I can't use the solve anymore. It's nice to have the solve there because as the radius changes during optimization, the location of the dummy surface automatically changes to the correct location.
Tol operand TSDX is invalid. Under multi-configuration control.
I recently finished optimizing my objective lens to two different configurations, but when I ran the tolerance analysis, I saw I had some work to do. So I thought I'd optimize again with my tolerance data using the TOLR operand in my merit function but Zemax tells me 'Tol operand TSDX is invalid. Under multi-configuration control. Is there a way to keep multi-configuration (as I'm optimizing for two configs) and use TOLR in the merit function and with TSDX in the tolerance editor?
Working with TM25 ray files
I came across this recent thread which seems to confirm that there is no direct way to use TM25 ray files in Zemax. The suggestion there is to go to the source of the ray file, and get a different format, which can be converted using a third party tool to a format Zemax can use. In my case, the source of the TM25 files does not provide any other format, so this is not an option for me. Is there anything else I might try? I don't have access to the IES TM25 spec, so converting the files myself is not really an option—and writing my own binary file parser is not something I would do with confidence or enthusiasm. Maybe someone at Zemax would like to take a stab at this? A quick-and-dirty, completely unsupported Python script would be a huge help. I'm not sure how many different types of information are contained in a TM25 file, but ray origins, directions, and intensities would be enough in my case.
I am simulating a simple polarimeter by rotating the quarter waveplate (qwp) by using multi-configuration. Is there a way that I can use universal plot to create a curve of the system transmission intensity vs. qwp rotating angle? The input will be linear or circular polarized light. Please advise!
HOE traslation from CodeV to ZOS
I am translating a customer’s Code V file with HOE diffrative surfaces to ZOS to make some non-sequential studies. I do not know how to configurate a holographic surface in ZOS to take into account the grooves of the holographic difractive surface in the stray analysis process. I will appreciate any help. Besides, do you know what is the correspondence between the Code V HOE surface definition and the ZOS HOE definition? Thanks in advance for your help.
Zemax file Versioning
I would like to know the versioning of Zemax file, for e.g. if I am working on a project, when it's done I will save it as a Sampleptoject.zmx, if I will do changes in the Sampleptoject.zmx, then how can I automatically save it as version1, version2, version3 and ....so on ? Present I am saving it manually.
Creating a Grid Phase .DAT file
I'm trying to create a Grid Phase data file to act as a phase screen, and the manual describes the file format as equivalent to a Grid Sag .DAT file, but that doesn't seem to be working for me. For a Grid Sag file, information is arranged as follows: ! nx ny delx dely unitflag xdec ydec
How severely do localized deformations affect RMS Spot Radius, and is that a useful metric?
I'm modelling a telescope system with a deformable mirror, and I am providing the deformed mirror surface as a grid sag data file. For the case with an extremely localized deformity (0.0014 to 0.0018% of the total mirror surface area deformed) with a PV difference of about one wavelength, the RMS Spot Radius changes from about 27 micron, to a few hundred micron (200-400 micron). My questions are as follows: 1) Is it expected that such a small deformity should have such a large effect on RMS Spot Radius? How is RMS Spot Radius calculated, and why does increasing the number of rays decrease the RMS Spot Radius? Why does the spot diagram appear mostly symmetric, when the deformity is localized? 2) Are there alternative Analysis parameters to determine the deterioration in image quality due to a single highly localized deformity, that can be used as a more suitable alternative to RMS spot radius? Would RMS wavefront error be a better parameter? Is there anythin
Display of rays and reflection
Hello, another dummy question. Reminder: I'm a new user, have ZOS 15 and modify an existing model. So I have some reflective surfaces defined by a coating, e.g. MYCOATING defined in the Coating Catalog by: ---------- Coating Name: MYCOATING (IDEAL) S-Polarization: T, tr, ti: 0.13210000 0.36345564 0.00000000 R, rr, ri: 0.86790000 0.93161151 0.00000000 A: 0.00000000 TIR: 1.00000000 P-Polarization: T, tr, ti: 0.13210000 0.36345564 0.00000000 R, rr, ri: 0.86790000&nb
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