Hello Users and Zemax Staff,

The design I am working on is chromatic aberration sensor. I would like to ask if there is a possibility to analyze peak irradiance on the detector in the function of wavelength of the light source. In other words, I need an information which wavelength of the light source (reflected from some surface) is focused best on the detector’s surface (at given Z position).

So far, I found Flux vs wavelength, which is great but only carry information about power (losses) and Dectector Viewer - but it only gives information about total (all wavelength) irradiance.

Light source is defined as spectrum file.

Best regards,

Michal Cwikla