For the sake of better understanding the impact of individual components I played with tilts and decenters of lenses imaging a diode array in the far field. One of the criteria was the far field divergence i.e. a rather precise cross-section profile at a certain distance. Due to tilts and/or decenters the image of the diode array on the (stationary) detector moves up and down. As such the image (footprint of the array) provides a certain degree of information (see attached) but it is impossible to apply e.g. the “Cross section row” feature in order to obtain a precise profile shape or get the correct numerical values thereof. This feature obviously works correctly only if the image lies on the X-axis of a detector. It is of course, possible to shift the detector in Y direction to place the (shifted) image on X-axis but it would be difficult to hit the precise Y-shift value.
Is it possible to add a “self-center” feature to “Cross section row” (or column) for such cases? Any other ideas/ suggestions?
Regards, Dusan
Best answer by Jeff.Wilde
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