@whit2452 

I’m not totally sure I understand what you want. But I can think of two features of OpticStudio that might be of interest. First, the Analyze..PSF..Huygens PSF has a neat feature to sum PSFs across multiple configurations. If you have multiple configurations, at the top of a Huygens PSF analysis, left of the (?) Help symbol, you can choose the configuration that should be used for the analysis or also choose All configurations, which will perform a coherent sum of the PSFs of each configuration.

You will find more details in the Help file about this feature. But you could have your different fields defined as configurations (instead of in the Field Editor). You can use Multi-Configuration (MC) operands such as YFIE. To change the Field Y value for different configurations. The problem is that if the fields are far away from one another, the calculation time quickly becomes prohibitive.

Second, since you have an image of the pinhole on your detector. You could use the Analyze..Extended Scene Analysis..Image Simulation to propagate your actual pinhole onto the detector while accounting for geometric and/or diffraction aberrations.

I hope this helps, and take care,

David