ZPL Operand: Optimize without vignetting TMA systems

  • 27 August 2021
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Some time ago, one of our engineers used the ZPL to create a ZPLM for analyzing TMA systems. A ReadMe doc and example file are attached below. 

Here is a summary of how the ZPLM works:

The ZPL actually checks that a surface does not vignette a ray in sequential mode. In sequential mode, a ray only knows about the next (n+1) surface that it's travelling to...the ray doesn't know about previous surfaces or surfaces beyond the next surface. Therefore, you can have surfaces other than n+1 which can clip the ray in real life but SEQ won't detect that.

 

 

The macro traces a specific marginal ray (±x or ±y) and targets the Mechanical Semi-Diameter of a specific surface. The ZPLM then forces a minimum clearance distance between between the edge of the mirror and the specified marginal ray.

 


 

 

Note: The ZPLM has been written with circular apertures in mind. For systems with other aperture types, the code will need to be updated. 

Additional note: This macro has not been rigorously tested, which is why it is not yet on the Code Exchange. We cannot guarantee the results, but it will be a good starting point for situations like these. 


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