Hello Users and Zemax Staff,
The design I am working on is chromatic aberration sensor. I would like to ask if there is a possibility to analyze peak irradiance on the detector in the function of wavelength of the light source. In other words, I need an information which wavelength of the light source (reflected from some surface) is focused best on the detector’s surface (at given Z position).
So far, I found Flux vs wavelength, which is great but only carry information about power (losses) and Dectector Viewer - but it only gives information about total (all wavelength) irradiance.
![](https://uploads-us-west-2.insided.com/zemax-en/attachment/564509e1-e8b4-4205-867e-e71fa94c9184.png)
Light source is defined as spectrum file.
![](https://uploads-us-west-2.insided.com/zemax-en/attachment/17f6870b-5dc6-4f62-a974-13fe62aa2c84.png)
Best regards,
Michal Cwikla
Best answer by Alissa Wilczynski
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