Zemax OpticsViewer 23.2.01 contains the following fixes and enhancements.

Feature Enhancements

• Reduced Restrictions on Surfaces Following GRINs - Designs that utilize GRIN surfaces in sequential mode can now have new surfaces follow them in the Lens Data Editor. The following surfaces are now supported: Extended Asphere, Extended Odd Asphere, Q-Type Asphere, Zernike Standard Sag, and Zernike Fringe Sag.

Catalog Updates

Materials:

• The Arton material catalog has been updated:  
  • Added 2 new materials: D4000 and F3500. D4000 is an improved version of the existing F5023 material, and F3500 is an improved version of F4520.  
  • Status of all materials except D4000 and F3500 was set to obsolete.
• The Sumita material catalog has been updated:  
  • Added 9 new materials: K-PBK60, K-LaSFn8W, K-SFLD8W, K-CSK158, K-PMK155, K-PSFn185, K-SKLD300, K-SKLD5, K-VC174.
  • Several glass materials were updated. Internal transmittance of K-LaSFn17 was updated. General specifications of K-SFLDn3 were updated. Internal transmittances defined with 3mm and 10mm thickness were updated.  
  • Status of K-CaFK95, K-PMK30, K-PSK100, K-PSK200, K-SKLD200, K-LaFK50, K-LaFK55, K-VC78, K-VC90, K-VC91, K-VC99, K-VC100, K-VC181, K-CD45, K-CD120, K-ZnSF8, K-PSFn3, K-PSFn190, K-PG325, K-PG375, K-FK5, K-BK7, K-SK16RH, K-SK18RH, K-LaK10, K-LaK12, K-LaK18, K-LaSFn1, K-LaSFn2, K-LaSFn3, K-LaSFn17, K-LaSFn22, K-BOC30, K-GIR140, and K-FIR98UV was updated.  
• The TEIJIN material catalog has been added:  
  • New catalog with 4 materials: AD-5503, SP-1516, SP-3810, SP-5590.
  • TEIJIN’s "SP" series are special polycarbonate resins for optical use. Due to high refractive index and low birefringence, these materials are suitable for making camera lenses smaller, thinner, and with higher performance. They also have a high heat resistance and are suitable for applications that require long-term reliability.  

Bug Fixes

• Afocal Mode - Fixed an issue where the afocal units from the System Explorer were not correctly reflected in the following sequential analyses: Through Focus Spot Diagram, Matrix Spot Diagram, Full Field Spot Diagram, and Configuration Matrix Spot Diagram.
• Toroidal Surface - Fixed an issue with calculating ray intercepts for Toroidal Surfaces in sequential mode that could cause discontinuous ray trace results in some cases.