Hi all,

I am studying the limits of a metrology instrument, and specially the FT lens contribution to systematic errors.

For this purpose, I simplify my system by a source, a thick lens, and a detector. I study this configuration with 3 different ways:

• Using jones calculus.
• Using Zemax optic studio sequential mode piloted with Python loops. I simulate the exact same configuration as studied with jones calculus. I have 2 models:
  • One using a ‘paraxial’ surface type with non-null thickness.
  • The other one using a standard surface.

However, I obtain 3 different results, and I lack the experience to identify the difference in assumptions or hypothesis between the 3 cases.

Could someone help me or point me in the right direction?

A lot of thanks for your time,

 Théo Sieg-Letessier.