Dear ZEMAX Team, 

for applications in the field of visual optics, it would be very helpful to a have a fast area-under-the-curve feature as a potential extension of {MTFA, MTFT, MTFS} included. Calculating this through a ZPLM is very time consuming due to the single frequency characteristic of GETMTF or OPEV(MTFS). The start and ending frequencies should be customizable and the feature should apply the diffraction limit too. 

Thank you very much for your support!

Best regards, 
Mario